Cynthia F. Murphy

	1997
2		Cynthia F. Murphy, Magdy S. Abadir, Peter Sandborn: Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. J. Electronic Testing 10(1-2): 151-166 (1997)
	1994
1		Magdy S. Abadir, Ashish Parikh, Linda Bal, Peter Sandborn, Cynthia F. Murphy: High Level Test Economics Advisor (Hi-TEA). J. Electronic Testing 5(2-3): 195-206 (1994)

Coauthor Index

1	Magdy S. Abadir	[1] [2]
2	Linda Bal	[1]
3	Ashish Parikh	[1]
4	Peter Sandborn	[1] [2]