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12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBenoit Nadeau-Dostie, Saman Adham, Russ Abbott: Improved Core Isolation and Access for Hierarchical Embedded Test. IEEE Design & Test of Computers 26(1): 18-25 (2009)
2004
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSaman Adham, Benoit Nadeau-Dostie: A BIST Algorithm for Bit/Group Write Enable Faults in SRAMs. MTDT 2004: 98-101
2002
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLStephen K. Sunter, Benoit Nadeau-Dostie: Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost. ITC 2002: 446-455
1999
9no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBenoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras: An embedded technique for at-speed interconnect testing. ITC 1999: 431-438
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSamir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie: Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1327-1340 (1999)
1996
7no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie: Built-In Self-Test: Assuring System Integrity. IEEE Computer 29(11): 39-45 (1996)
1995
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBenoit Nadeau-Dostie, Harry Hulvershorn, Saman Adham: A New Hardware Fault Insertion Scheme for System Diagnostics Verification. ITC 1995: 994-1002
1994
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBenoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan: ScanBist: A Multifrequency Scan-Based BIST Method. IEEE Design & Test of Computers 11(1): 7-17 (1994)
1992
4no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBenoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan: ScanBIST: A Multi-frequency Scan-based BIST Method. ITC 1992: 506-513
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbu S. M. Hassan, Vinod K. Agarwal, Benoit Nadeau-Dostie, Janusz Rajski: BIST of PCB interconnects using boundary-scan architecture. IEEE Trans. on CAD of Integrated Circuits and Systems 11(10): 1278-1288 (1992)
1990
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLBenoit Nadeau-Dostie, Allan Silburt, Vinod K. Agarwal: Serial Interfacing for Embedded-Memory Testing. IEEE Design & Test of Computers 7(2): 52-63 (1990)
1989
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbu S. M. Hassan, Vinod K. Agarwal, Janusz Rajski, Benoit Nadeau-Dostie: Testing of Glue Logic Interconnects Using Boundary Scan Architecture. ITC 1989: 700-711

Coauthor Index

1Russ Abbott [12]
2Saman Adham [6] [11] [12]
3Vinod K. Agarwal [1] [2] [3]
4Ben Bennetts (R. G. Bennetts) [7]
5Samir Boubezari [8]
6Dwayne Burek [4] [5]
7Eduard Cerny [8]
8Jean-Francois Cote [9]
9Abu S. M. Hassan [1] [3] [4] [5]
10Harry Hulvershorn [6] [9]
11Najmi T. Jarwala [7]
12Bozena Kaminska [8]
13Bernd Könemann [7]
14Stephen Pateras [9]
15Janusz Rajski [1] [3]
16Allan Silburt [2]
17Stephen K. Sunter [10]

Copyright © Sat Nov 28 20:06:51 2009 by Michael Ley (ley@uni-trier.de)