Pradeep Nagaraj

	2008
2		Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar: Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. J. Electronic Testing 24(1-3): 165-179 (2008)
	2001
1		Pradeep Nagaraj, Shambhu Upadhaya, Kamran Zarrineh, R. Dean Adams: Defect Analysis and a New Fault Model for Multi-port SRAMs. DFT 2001: 366-374

Coauthor Index

1	R. Dean Adams	[1]
2	Lushan Liu	[2]
3	Ramalingam Sridhar	[2]
4	Shambhu Upadhaya	[1]
5	Shambhu J. Upadhyaya	[2]
6	Kamran Zarrineh	[1]