M. Nagatani

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1986

1 Norio Kuji, Teruo Tamama, M. Nagatani: FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(2): 313-319 (1986)

	1986
1		Norio Kuji, Teruo Tamama, M. Nagatani: FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(2): 313-319 (1986)

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