Ravindra Nair

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1979

2 Ravindra Nair: Comments on ``An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories''. IEEE Trans. Computers 28(3): 258-261 (1979)

1978

1 Ravindra Nair, Satish M. Thatte, Jacob A. Abraham: Efficient Algorithms for Testing Semiconductor Random-Access Memories. IEEE Trans. Computers 27(6): 572-576 (1978)

	1979
2		Ravindra Nair: Comments on ``An Optimal Algorithm for Testing Stuck-at Faults in Random Access Memories''. IEEE Trans. Computers 28(3): 258-261 (1979)
	1978
1		Ravindra Nair, Satish M. Thatte, Jacob A. Abraham: Efficient Algorithms for Testing Semiconductor Random-Access Memories. IEEE Trans. Computers 27(6): 572-576 (1978)

Coauthor Index

1 Jacob A. Abraham [1]

2 Satish M. Thatte [1]