I. Nakajima

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2006

1 Masahiro Hayashi, Takeo Abe, I. Nakajima: Transformation from availability expression to failure frequency expression. IEEE Transactions on Reliability 55(2): 252-261 (2006)

	2006
1		Masahiro Hayashi, Takeo Abe, I. Nakajima: Transformation from availability expression to failure frequency expression. IEEE Transactions on Reliability 55(2): 252-261 (2006)

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