Bart Nauwelaers Coauthor index DBLP Vis pubzone.org

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DBLP keys2007
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGeert Deconinck, Koen Vanthournout, Hakem Beitollahi, Zhifeng Qui, Rui Duan, Bart Nauwelaers, Emmanuel Van Lil, Johan Driesen, Ronnie Belmans: A Robust Semantic Overlay Network for Microgrid Control Applications. WADS 2007: 101-123
2006
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Balachandran, Steven Brebels, G. Carchon, T. Webers, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Analysis and modeling of power grid transmission lines. DATE 2006: 33-38
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Balachandran, Steven Brebels, G. Carchon, Walter De Raedt, Eric Beyne, M. Kuijk, Bart Nauwelaers: Constant Impedance Scaling Paradigm for Scaling LC transmission lines. ISQED 2006: 387-392
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Balachandran, Steven Brebels, G. Carchon, M. Kuijk, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Constant impedance scaling paradigm for interconnect synthesis. SLIP 2006: 99-105
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Balachandran, Steven Brebels, G. Carchon, M. Kuijk, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Wafer-level package interconnect options. IEEE Trans. VLSI Syst. 14(6): 654-659 (2006)
2005
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJ. Balachandran, Steven Brebels, G. Carchon, T. Webers, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Package level interconnect options. SLIP 2005: 21-27
2003
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLArun Chandrasekhar, Steven Brebels, Serguei Stoukatch, Eric Beyne, Walter De Raedt, Bart Nauwelaers: The influence of packaging materials on RF performance. Microelectronics Reliability 43(3): 351-357 (2003)
2002
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHasan Ymeri, Bart Nauwelaers, Karen Maex, David De Roest, Michele Stucchi, Servaas Vandenberghe: Simple and Efficient Approach for Shunt Admittance Parameters Calculations of VLSI On-Chip Interconnects on Semiconducting Substrate. DATE 2002: 1113
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHasan Ymeri, Bart Nauwelaers, Karen Maex, Servaas Vandenberghe, David De Roest: A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate. Microprocessors and Microsystems 26(1): 45-48 (2002)
2001
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHasan Ymeri, Bart Nauwelaers, Karen Maex: Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate. Integration 30(2): 133-141 (2001)
2000
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHasan Ymeri, Bart Nauwelaers, Karen Maex: Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method. Integration 30(1): 55-63 (2000)

Coauthor Index

1J. Balachandran [6] [7] [8] [9] [10]
2Hakem Beitollahi [11]
3Ronnie Belmans [11]
4Eric Beyne [5] [6] [7] [8] [9] [10]
5Steven Brebels [5] [6] [7] [8] [9] [10]
6G. Carchon [6] [7] [8] [9] [10]
7Arun Chandrasekhar [5]
8Geert Deconinck [11]
9Johan Driesen [11]
10Rui Duan [11]
11M. Kuijk [7] [8] [9]
12Emmanuel Van Lil [11]
13Karen Maex [1] [2] [3] [4]
14Zhifeng Qui [11]
15Walter De Raedt [5] [6] [7] [8] [9] [10]
16David De Roest [3] [4]
17Serguei Stoukatch [5]
18Michele Stucchi [4]
19Servaas Vandenberghe [3] [4]
20Koen Vanthournout [11]
21T. Webers [6] [10]
22Hasan Ymeri [1] [2] [3] [4]

Colors in the list of coauthors

Copyright © Wed Nov 11 17:18:37 2009 by Michael Ley (ley@uni-trier.de)