| 2009 | ||
|---|---|---|
| 1 | Ada N. Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S. M. Fung, W. H. Leung: Reference-Free Machine Vision Inspection of semiconductor die Images. Int. J. Image Graphics 9(1): 133-152 (2009) | |
| 1 | Ronald Chung | [1] |
| 2 | Kenneth S. M. Fung | [1] |
| 3 | Edmund Y. Lam | [1] |
| 4 | W. H. Leung | [1] |