Tom Nicholls

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2002

1 Frank Gao, Ravi Chanana, Tom Nicholls: The effects of buffer thickness on GaAs MESFET characteristics: channel-substrate current, drain breakdown, and reliability. Microelectronics Reliability 42(7): 1003-1010 (2002)

	2002
1		Frank Gao, Ravi Chanana, Tom Nicholls: The effects of buffer thickness on GaAs MESFET characteristics: channel-substrate current, drain breakdown, and reliability. Microelectronics Reliability 42(7): 1003-1010 (2002)

Coauthor Index

1 Ravi Chanana [1]

2 Frank Gao [1]