André Nieuwland

	2006
2		Tino Heijmen, André Nieuwland: Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. European Test Symposium 2006: 247-252
	2001
1		Om Prakash Gangwal, André Nieuwland, Paul E. R. Lippens: A scalable and flexible data synchronization scheme for embedded HW-SW shared-memory systems. ISSS 2001: 1-6

Coauthor Index

1	Om Prakash Gangwal	[1]
2	Tino Heijmen	[2]
3	Paul E. R. Lippens	[1]

Colors in the list of coauthors