H. Keith Nishihara

	1988
2		H. Keith Nishihara, P. A. Crossley: Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions. IEEE Trans. Pattern Anal. Mach. Intell. 10(1): 17-30 (1988)
	1981
1		H. Keith Nishihara: Intensity, Visible-Surface, and Volumetric Representations. Artif. Intell. 17(1-3): 265-284 (1981)

Coauthor Index

1

P. A. Crossley

[2]