Jiri Nosek

	2004
4		Ondrej Novák, Zdenek Plíva, Jiri Nosek, Andrzej Hlawiczka, Tomasz Garbolino, Krzysztof Gucwa: Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor. J. Electronic Testing 20(1): 109-122 (2004)
	2001
3		Ondrej Novák, Jiri Nosek: Test Pattern Decompression Using a Scan Chain. DFT 2001: 110-115
2		Ondrej Novák, Jiri Nosek: Test-per-Clock Testing of the Circuits with Scan. IOLTW 2001: 90-
	2000
1		Ondrej Novák, Jiri Nosek: On Using Deterministic Test Sets in BIST. IOLTW 2000: 127-132

Coauthor Index

1	Tomasz Garbolino	[4]
2	Krzysztof Gucwa	[4]
3	Andrzej Hlawiczka	[4]
4	Ondrej Novák	[1] [2] [3] [4]
5	Zdenek Plíva	[4]