Yuji Ohsumi

	2007
1		Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532

Coauthor Index

1	Seiji Kajihara	[1]
2	Kohei Miyase	[1]
3	Kewal K. Saluja	[1]
4	Tatsuya Suzuki	[1]
5	Xiaoqing Wen	[1]