Stig Oresjo

	1997
4		Stig Oresjo: Unpowered Opens Test with X-Ray Laminography. ITC 1997: 276
	1996
3		Stig Oresjo: Unpowered Opens Test with X-Ray Laminography. ITC 1996: 929
	1993
2		Kenneth P. Parker, John E. McDermid, Stig Oresjo: Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322
	1991
1		Kenneth P. Parker, Stig Oresjo: A language for describing boundary scan devices. J. Electronic Testing 2(1): 43-75 (1991)

Coauthor Index

1	John E. McDermid	[2]
2	Kenneth P. Parker	[1] [2]