| 2009 | ||
|---|---|---|
| 35 | Michael Orshansky, Wei-Shen Wang: Statistical analysis of circuit timing using majorization. Commun. ACM 52(8): 95-100 (2009) | |
| 2008 | ||
| 34 | Shayak Banerjee, Praveen Elakkumanan, Lars Liebmann, Michael Orshansky: Electrically driven optical proximity correction based on linear programming. ICCAD 2008: 473-479 | |
| 33 | Bin Zhang, Michael Orshansky: Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation. ISQED 2008: 774-779 | |
| 32 | Naresh R. Shanbhag, Subhasish Mitra, Gustavo de Veciana, Michael Orshansky, Radu Marculescu, Jaijeet Roychowdhury, Douglas L. Jones, Jan M. Rabaey: The Search for Alternative Computational Paradigms. IEEE Design & Test of Computers 25(4): 334-343 (2008) | |
| 2007 | ||
| 31 | Rajeshwary Tayade, Vijay Kiran Kalyanam, Sani R. Nassif, Michael Orshansky, Jacob A. Abraham: Estimating path delay distribution considering coupling noise. ACM Great Lakes Symposium on VLSI 2007: 61-66 | |
| 30 | Anand Ramalingam, Ashish Kumar Singh, Sani R. Nassif, Michael Orshansky, David Z. Pan: Accurate Waveform Modeling using Singular Value Decomposition with Applications to Timing Analysis. DAC 2007: 148-153 | |
| 29 | Ashish Kumar Singh, Adnan Aziz, Sriram Vishwanath, Michael Orshansky: Generation of Efficient Codes for Realizing Boolean Functions in Nanotechnologies CoRR abs/cs/0703102: (2007) | |
| 28 | Murari Mani, Anirudh Devgan, Michael Orshansky, Yaping Zhan: A Statistical Algorithm for Power- and Timing-Limited Parametric Yield Optimization of Large Integrated Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1790-1802 (2007) | |
| 27 | Wei-Shen Wang, Michael Orshansky: Estimation of Leakage Power Consumption and Parametric Yield Based on Realistic Probabilistic Descriptions of Parameters. J. Low Power Electronics 3(1): 1-12 (2007) | |
| 26 | Kypros Constantinides, Stephen Plaza, Jason A. Blome, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Bin Zhang, Michael Orshansky: Architecting a reliable CMP switch architecture. TACO 4(1): (2007) | |
| 2006 | ||
| 25 | Joonsoo Kim, Michael Orshansky: Towards formal probabilistic power-performance design space exploration. ACM Great Lakes Symposium on VLSI 2006: 229-234 | |
| 24 | Murari Mani, Mahesh Sharma, Michael Orshansky: Application of fast SOCP based statistical sizing in the microprocessor design flow. ACM Great Lakes Symposium on VLSI 2006: 372-375 | |
| 23 | Wei-Shen Wang, Vladik Kreinovich, Michael Orshansky: Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty. DAC 2006: 161-166 | |
| 22 | Ashish Kumar Singh, Murari Mani, Ruchir Puri, Michael Orshansky: Gain-based technology mapping for minimum runtime leakage under input vector uncertainty. DAC 2006: 522-527 | |
| 21 | Kypros Constantinides, Stephen Plaza, Jason A. Blome, Bin Zhang, Valeria Bertacco, Scott A. Mahlke, Todd M. Austin, Michael Orshansky: BulletProof: a defect-tolerant CMP switch architecture. HPCA 2006: 5-16 | |
| 20 | Murari Mani, Ashish Kumar Singh, Michael Orshansky: Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization. ICCAD 2006: 19-26 | |
| 19 | Anand Ramalingam, Gi-Joon Nam, Ashish Kumar Singh, Michael Orshansky, Sani R. Nassif, David Z. Pan: An accurate sparse matrix based framework for statistical static timing analysis. ICCAD 2006: 231-236 | |
| 18 | Bin Zhang, Ari Arapostathis, Sani R. Nassif, Michael Orshansky: Analytical modeling of SRAM dynamic stability. ICCAD 2006: 315-322 | |
| 17 | Wei-Shen Wang, Michael Orshansky: Robust estimation of parametric yield under limited descriptions of uncertainty. ICCAD 2006: 884-890 | |
| 16 | Keith A. Bowman, Michael Orshansky, Sachin S. Sapatnekar: Tutorial II: Variability and Its Impact on Design. ISQED 2006: 5 | |
| 15 | Bin Zhang, Wei-Shen Wang, Michael Orshansky: FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs. ISQED 2006: 755-760 | |
| 14 | Michael Orshansky, Wei-Shen Wang, Martine Ceberio, Gang Xiang: Interval-based robust statistical techniques for non-negative convex functions, with application to timing analysis of computer chips. SAC 2006: 1645-1649 | |
| 13 | Wei-Shen Wang, Michael Orshansky: Path-Based Statistical Timing Analysis Handling Arbitrary Delay Correlations: Theory and Implementation. IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 2976-2988 (2006) | |
| 12 | Wei-Shen Wang, Michael Liu, Michael Orshansky: Analysis of Leakage Power Reduction in Dual-Vth Technologies in the Presence of Large Threshold Voltage Variation. J. Low Power Electronics 2(1): 1-7 (2006) | |
| 2005 | ||
| 11 | Murari Mani, Anirudh Devgan, Michael Orshansky: An efficient algorithm for statistical minimization of total power under timing yield constraints. DAC 2005: 309-314 | |
| 10 | Ashish Kumar Singh, Murari Mani, Michael Orshansky: Statistical technology mapping for parametric yield. ICCAD 2005: 511-518 | |
| 2004 | ||
| 9 | Michael Orshansky, Arnab Bandyopadhyay: Fast statistical timing analysis handling arbitrary delay correlations. DAC 2004: 337-342 | |
| 8 | Murari Mani, Michael Orshansky: A New Statistical Optimization Algorithm for Gate Sizing. ICCD 2004: 272-277 | |
| 7 | Michael Liu, Wei-Shen Wang, Michael Orshansky: Leakage power reduction by dual-vth designs under probabilistic analysis of vth variation. ISLPED 2004: 2-7 | |
| 2003 | ||
| 6 | David Nguyen, Abhijit Davare, Michael Orshansky, David G. Chinnery, Brandon Thompson, Kurt Keutzer: Minimization of dynamic and static power through joint assignment of threshold voltages and sizing optimization. ISLPED 2003: 158-163 | |
| 2002 | ||
| 5 | Michael Orshansky, Kurt Keutzer: A general probabilistic framework for worst case timing analysis. DAC 2002: 556-561 | |
| 4 | Kurt Keutzer, Michael Orshansky: From blind certainty to informed uncertainty. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 37-41 | |
| 3 | Michael Orshansky, Linda Milor, Pinhong Chen, Kurt Keutzer, Chenming Hu: Impact of spatial intrachip gate length variability on theperformance of high-speed digital circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 21(5): 544-553 (2002) | |
| 2000 | ||
| 2 | Michael Orshansky, Linda Milor, Pinhong Chen, Kurt Keutzer, Chenming Hu: Impact of Systematic Spatial Intra-Chip Gate Length Variability on Performance of High-Speed Digital Circuits. ICCAD 2000: 62-67 | |
| 1998 | ||
| 1 | Michael Orshansky, James C. Chen, Chenming Hu: A Statistical Performance Simulation Methodology for VLSI Circuits. DAC 1998: 402-407 | |