| 2005 | ||
|---|---|---|
| 1 | Akira Yamazaki, Fukashi Morishita, Naoya Watanabe, Teruhiko Amano, Masaru Haraguchi, Hideyuki Noda, Atsushi Hachisuka, Katsumi Dosaka, Kazutami Arimoto, Setsuo Wake, Hideyuki Ozaki, Tsutomu Yoshihara: A Study of Sense-Voltage Margins in Low-Voltage-Operating Embedded DRAM Macros. IEICE Transactions 88-C(10): 2020-2027 (2005) | |