Sule Ozev

	2009
56		Ender Yilmaz, Sule Ozev: Adaptive test elimination for analog/RF circuits. DAC 2009: 720-725
	2008
55		Bogdan F. Romanescu, Michael E. Bauer, Sule Ozev, Daniel J. Sorin: Reducing the impact of intra-core process variability with criticality-based resource allocation and prefetching. Conf. Computing Frontiers 2008: 129-138
54		Ender Yilmaz, Sule Ozev: Dynamic test scheduling for analog circuits for improved test quality. ICCD 2008: 227-233
53		Erdem Serkan Erdogan, Sule Ozev, Philippe Cauvet: Diagnosis of assembly failures for System-in-Package RF tuners. ISCAS 2008: 2286-2289
52		Erdem Serkan Erdogan, Sule Ozev: Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers. VTS 2008: 209-214
51		Fang Liu, Sule Ozev, Plamen K. Nikolov: Parametric variability analysis for multistage analog circuits using analytical sensitivity modeling. ACM Trans. Design Autom. Electr. Syst. 13(2): (2008)
50		Erkan Acar, Sule Ozev: Defect-Oriented Testing of RF Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 920-931 (2008)
	2007
49		Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar: AWafer-Level Defect Screening Technique to Reduce Test and Packaging Costs for "Big-D/Small-A" Mixed-Signal SoCs. ASP-DAC 2007: 823-828
48		Erdem Serkan Erdogan, Sule Ozev: An ADC-BiST scheme using sequential code analysis. DATE 2007: 713-718
47		Mahmut Yilmaz, Albert Meixner, Sule Ozev, Daniel J. Sorin: Lazy Error Detection for Microprocessor Functional Units. DFT 2007: 361-369
46		Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz: Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. ICCD 2007: 317-324
45		Erkan Acar, Sule Ozev: Digital calibration of RF transceivers for I-Q imbalances and nonlinearity. ICCD 2007: 512-517
44		Bogdan F. Romanescu, Michael E. Bauer, Daniel J. Sorin, Sule Ozev: Reducing the Impact of Process Variability with Prefetching and Criticality-Based Resource Allocation. PACT 2007: 424
43		Erkan Acar, Sule Ozev, Kevin B. Redmond: A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up. VTS 2007: 3-8
42		Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores CoRR abs/0710.4686: (2007)
41		Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown CoRR abs/0710.4715: (2007)
40		Erkan Acar, Sule Ozev: Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup. IEEE Trans. VLSI Syst. 15(1): 37-47 (2007)
39		Fang Liu, Sule Ozev: Statistical Test Development for Analog Circuits Under High Process Variations. IEEE Trans. on CAD of Integrated Circuits and Systems 26(8): 1465-1477 (2007)
38		Fred A. Bower, Daniel J. Sorin, Sule Ozev: Online diagnosis of hard faults in microprocessors. TACO 4(2): (2007)
	2006
37		Erkan Acar, Sule Ozev, Kevin B. Redmond: Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers. ICCAD 2006: 210-216
36		Erkan Acar, Sule Ozev: Efficient Testing of RF MIMO Transceivers Used in WLAN Applications. ICCD 2006
35		Fred A. Bower, Derek Hower, Mahmut Yilmaz, Daniel J. Sorin, Sule Ozev: Applying architectural vulnerability Analysis to hard faults in the microprocessor. SIGMETRICS/Performance 2006: 375-376
34		Fang Liu, Plamen K. Nikolov, Sule Ozev: Parametric Fault Diagnosis for Analog Circuits Using a Bayesian Framework. VTS 2006: 272-277
33		Fei Su, Sule Ozev, Krishnendu Chakrabarty: Concurrent testing of digital microfluidics-based biochips. ACM Trans. Design Autom. Electr. Syst. 11(2): 442-464 (2006)
32		Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: Test infrastructure design for mixed-signal SOCs with wrapped analog cores. IEEE Trans. VLSI Syst. 14(3): 292-304 (2006)
31		Fang Liu, Sule Ozev, Martin A. Brooke: Identifying the Source of BW Failures in High-Frequency Linear Analog Circuits Based on S-Parameter Measurements. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2594-2605 (2006)
30		Fei Su, Sule Ozev, Krishnendu Chakrabarty: Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems. J. Electronic Testing 22(2): 199-210 (2006)
	2005
29		Fang Liu, Sule Ozev: Hierarchical analysis of process variation for mixed-signal systems. ASP-DAC 2005: 465-470
28		Fang Liu, Jacob J. Flomenberg, Devaka V. Yasaratne, Sule Ozev: Hierarchical Variance Analysis for Analog Circuits Based on Graph Modelling and Correlation Loop Tracing. DATE 2005: 126-131
27		Jonathan R. Carter, Sule Ozev, Daniel J. Sorin: Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown. DATE 2005: 300-305
26		Anuja Sehgal, Fang Liu, Sule Ozev, Krishnendu Chakrabarty: Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores. DATE 2005: 50-55
25		Erkan Acar, Sule Ozev: Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions. ICCAD 2005: 73-79
24		Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: A Flexible Design Methodology for Analog Test Wrappers in Mixed-Signal SOCs. ICCD 2005: 137-142
23		Fang Liu, Sule Ozev: Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits. ICCD 2005: 161-170
22		Fred A. Bower, Daniel J. Sorin, Sule Ozev: A Mechanism for Online Diagnosis of Hard Faults in Microprocessors. MICRO 2005: 197-208
21		Erkan Acar, Sule Ozev: Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements. VTS 2005: 374-379
20		Fred A. Bower, Sule Ozev, Daniel J. Sorin: Autonomic Microprocessor Execution via Self-Repairing Arrays. IEEE Trans. Dependable Sec. Comput. 2(4): 297-310 (2005)
	2004
19		Fred A. Bower, Paul G. Shealy, Sule Ozev, Daniel J. Sorin: Tolerating Hard Faults in Microprocessor Array Structures. DSN 2004: 51-60
18		Fang Liu, Sule Ozev, Martin A. Brooke: Diagnosis of small-signal parameters for broadband amplifiers through S-parameter measurements and sensitivity-guided evolutionary search. ICCAD 2004: 641-647
17		Sule Ozev, Alex Orailoglu: End-to-End Testability Analysis and DfT Insertion for Mixed-Signal Paths. ICCD 2004: 72-77
16		Erkan Acar, Sule Ozev: Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. ITC 2004: 783-792
15		Sule Ozev, Christian Olgaard: Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures. VTS 2004: 217-222
14		Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu: Seamless Test of Digital Components in Mixed-Signal Paths. IEEE Design & Test of Computers 21(1): 44-55 (2004)
13		Sule Ozev, Alex Orailoglu: Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead. IEEE Trans. VLSI Syst. 12(7): 756-765 (2004)
	2003
12		Anuja Sehgal, Sule Ozev, Krishnendu Chakrabarty: TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers. ICCAD 2003: 95-99
11		Fei Su, Sule Ozev, Krishnendu Chakrabarty: Testing of Droplet-Based Microelectrofluidic Systems. ITC 2003: 1192-1200
10		Sule Ozev, Alex Orailoglu: Statistical Tolerance Analysis for Assured Analog Test Coverage. J. Electronic Testing 19(2): 173-182 (2003)
	2002
9		Sule Ozev, Alex Orailoglu: Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits. ICCD 2002: 258-264
8		Sule Ozev, Alex Orailoglu, Hosam Haggag: Automated test development and test time reduction for RF subsystems. ISCAS (1) 2002: 581-584
7		Sule Ozev, Alex Orailoglu: An Integrated Tool for Analog Test Generation and Fault Simulation. ISQED 2002: 267-272
6		Sule Ozev, Alex Orailoglu: Boosting the Accuracy of Analog Test Coverage Computation through Statistical Tolerance Analysis. VTS 2002: 213-222
5		Sule Ozev, Christian Olgaard, Alex Orailoglu: Multilevel Testability Analysis and Solutions for Integrated Bluetooth Transceivers. IEEE Design & Test of Computers 19(5): 82-91 (2002)
	2001
4		Christian Olgaard, Sule Ozev, Alex Orailoglu: Testability implications in low-cost integrated radio transceivers: a Bluetooth case study. ITC 2001: 965-974
	2000
3		Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu: Test Synthesis for Mixed-Signal SOC Paths. DATE 2000: 128-133
2		Sule Ozev, Alex Orailoglu: Test Selection Based on High Level Fault Simulation for Mixed-Signal Systems. VTS 2000: 149-156
	1999
1		Sule Ozev, Alex Orailoglu: Low-Cost Test for Large Analog IC's. DFT 1999: 101-

Coauthor Index

1	Erkan Acar	[16] [21] [25] [36] [37] [40] [43] [45] [50]
2	Sudarshan Bahukudumbi	[49]
3	Michael E. Bauer	[44] [55]
4	Ismet Bayraktaroglu	[3] [14]
5	Fred A. Bower	[19] [20] [22] [35] [38]
6	Martin A. Brooke	[18] [31]
7	Jonathan R. Carter	[27] [41]
8	Philippe Cauvet	[53]
9	Krishnendu Chakrabarty	[11] [12] [24] [26] [30] [32] [33] [42] [49]
10	Erdem Serkan Erdogan	[48] [52] [53]
11	Jacob J. Flomenberg	[28]
12	Hosam Haggag	[8]
13	Derek Hower	[35]
14	Vikram Iyengar	[49]
15	Fang Liu	[18] [23] [26] [28] [29] [31] [34] [39] [42] [51]
16	Albert Meixner	[47]
17	Plamen K. Nikolov	[34] [51]
18	Christian Olgaard	[4] [5] [15]
19	Alex Orailoglu	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [13] [14] [17]
20	Kevin B. Redmond	[37] [43]
21	Bogdan F. Romanescu	[44] [55]
22	Anuja Sehgal	[12] [24] [26] [32] [42]
23	Paul G. Shealy	[19]
24	Daniel J. Sorin	[19] [20] [22] [27] [35] [38] [41] [44] [46] [47] [55]
25	Fei Su	[11] [30] [33]
26	Devaka V. Yasaratne	[28]
27	Ender Yilmaz	[54] [56]
28	Mahmut Yilmaz	[35] [46] [47]

Colors in the list of coauthors