| 1997 | ||
|---|---|---|
| 2 | Lynn Youngs, Siva Paramanandam: Mapping and Repairing Embedded-Memory Defects. IEEE Design & Test of Computers 14(1): 18-24 (1997) | |
| 1995 | ||
| 1 | Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam: Testability, Debuggability, and Manufacturability Features of the UltraSPARCTM-I Microprocessor. ITC 1995: 157-166 | |
| 1 | Greg Billus | [1] |
| 2 | G. P. Grewal | [1] |
| 3 | Anjali Jones | [1] |
| 4 | Marc E. Levitt | [1] |
| 5 | Sridhar Narayanan | [1] |
| 6 | Srinivas Nori | [1] |
| 7 | Lynn Youngs | [1] [2] |