N. Patil

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2006

1 Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918

	2006
1		Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918

Coauthor Index

1	R. D. (Shawn) Blanton (Ronald D. Blanton)	[1]
2	Jason G. Brown	[1]
3	Rao Desineni	[1]
4	Wojciech Maly	[1]
5	Jeffrey E. Nelson	[1]
6	Thomas Zanon	[1]