| 2007 | ||
|---|---|---|
| 2 | EE | Jon G. Elerath, Michael Pecht: Enhanced Reliability Modeling of RAID Storage Systems. DSN 2007: 175-184 |
| 2006 | ||
| 1 | EE | Michael Pecht, Yuliang Deng: Electronic device encapsulation using red phosphorus flame retardants. Microelectronics Reliability 46(1): 53-62 (2006) |
| 1 | Yuliang Deng | [1] |
| 2 | Jon G. Elerath | [2] |