A. Petitqueux

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2003

2 Marie-Lise Flottes, Christian Landrault, A. Petitqueux: A Unified DFT Approach for BIST and External Test. J. Electronic Testing 19(1): 49-60 (2003)

2000

1 Marie-Lise Flottes, Christian Landrault, A. Petitqueux: Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. Asian Test Symposium 2000: 404-

	2003
2		Marie-Lise Flottes, Christian Landrault, A. Petitqueux: A Unified DFT Approach for BIST and External Test. J. Electronic Testing 19(1): 49-60 (2003)
	2000
1		Marie-Lise Flottes, Christian Landrault, A. Petitqueux: Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. Asian Test Symposium 2000: 404-

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