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DBLP keys2009
74Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348
73Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYoussef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: Comprehensive bridging fault diagnosis based on the SLAT paradigm. DDECS 2009: 264-269
72Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda: An efficient fault simulation technique for transition faults in non-scan sequential circuits. DDECS 2009: 50-55
71Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYoussef Benabboud, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: A case study on logic diagnosis for System-on-Chip. ISQED 2009: 253-259
2008
70Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485
69Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi: SoC Symbolic Simulation: a case study on delay fault testing. DDECS 2008: 320-325
68Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Improving Diagnosis Resolution without Physical Information. DELTA 2008: 210-215
67Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJulien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Using TMR Architectures for Yield Improvement. DFT 2008: 7-15
66Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94
65Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing 24(4): 353-364 (2008)
2007
64Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533
63no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Mixed Approach for Unified Logic Diagnosis. DDECS 2007: 239-242
62Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: DERRIC: A Tool for Unified Logic Diagnosis. European Test Symposium 2007: 13-20
61Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLO. Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. European Test Symposium 2007: 77-84
60Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. European Test Symposium 2007: 97-104
59Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368
58Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLO. Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. VTS 2007: 47-52
57Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007)
2006
56no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261
55Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich: Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. VLSI-SoC 2006: 403-408
54Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLO. Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: An Overview of Failure Mechanisms in Embedded Flash Memories. VTS 2006: 108-113
53Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Gated Clock Scheme for Low Power Testing of Logic Cores. J. Electronic Testing 22(1): 89-99 (2006)
52Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs. J. Electronic Testing 22(2): 161-172 (2006)
51Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electronic Testing 22(3): 287-296 (2006)
2005
50Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862
49Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS 2005: 540-549
48Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLNabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault: Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles. VLSI-SoC 2005: 267-281
47Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan: Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188
46Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs. J. Electronic Testing 21(1): 43-55 (2005)
45Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSimone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electronic Testing 21(2): 169-179 (2005)
44Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electronic Testing 21(5): 551-561 (2005)
2004
43Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271
42Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DATE 2004: 62-67
41Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DELTA 2004: 287-294
40Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: High Quality TPG for Delay Faults in Look-Up Tables of FPGAs. DELTA 2004: 83-88
39Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: BIST of Delay Faults in the Logic Architecture of Symmetrical FPGAs. IOLTS 2004: 187-192
38Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: March iC-: An Improved Version of March C- for ADOFs Detection. VTS 2004: 129-138
37Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Power-Driven Routing-Constrained Scan Chain Design. J. Electronic Testing 20(6): 647-660 (2004)
2003
36Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLLuigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255
35Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: Defect Analysis for Delay-Fault BIST in FPGAs. IOLTS 2003: 124-128
34Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. ITC 2003: 488-493
2002
33Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Test Power: a Big Issue in Large SOC Designs. DELTA 2002: 447-449
32Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Power Driven Chaining of Flip-Flops in Scan Architectures. ITC 2002: 796-803
31Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRené David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: On Using Efficient Test Sequences for BIST. VTS 2002: 145-152
30Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich: High Defect Coverage with Low-Power Test Sequences in a BIST Environment. IEEE Design & Test of Computers 19(5): 44-52 (2002)
29Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRené David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Hardware Generation of Random Single Input Change Test Sequences. J. Electronic Testing 18(2): 145-157 (2002)
2001
28Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Gated Clock Scheme for Low Power Scan Testing of Logic ICs or Embedded Cores. Asian Test Symposium 2001: 253-258
27Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Gated Clock Scheme for Low Power Scan-Based BIST. IOLTW 2001: 87-89
26no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLRené David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Random Adjacent Sequences: An Efficient Solution for Logic BIST. VLSI-SOC 2001: 413-424
25Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Hans-Joachim Wunderlich: A Modified Clock Scheme for a Low Power BIST Test Pattern Generator. VTS 2001: 306-311
24Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLArnaud Virazel, René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences. J. Electronic Testing 17(3-4): 233-241 (2001)
2000
23Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: An adjacency-based test pattern generator for low power BIST design. Asian Test Symposium 2000: 459-464
22Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. IOLTW 2000: 121-126
21no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Loïs Guiller, Serge Pravossoudovitch: Low power BIST design by hypergraph partitioning: methodology and architectures. ITC 2000: 652-661
20Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSalvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, P. Teixeira, M. Santos: Low Power BIST by Filtering Non-Detecting Vectors. J. Electronic Testing 16(3): 193-202 (2000)
1999
19Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Circuit Partitioning for Low Power BIST Design with Minimized Peak Power Consumption. Asian Test Symposium 1999: 89-94
18Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Test Vector Ordering Technique for Switching Activity Reduction During Test Operation. Great Lakes Symposium on VLSI 1999: 24-
17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, P. Teixeira, M. Santos: Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. ISCAS (1) 1999: 110-113
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Test Vector Inhibiting Technique for Low Energy BIST Design. VTS 1999: 407-412
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel: A Scan-BIST Structure to Test Delay Faults in Sequential Circuits. J. Electronic Testing 14(1-2): 95-102 (1999)
1998
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel: A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium 1998: 435-439
1997
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch, D. Severac: A gate resizing technique for high reduction in power consumption. ISLPED 1997: 281-286
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch: An optimized BIST test pattern generator for delay testing. VTS 1997: 94-100
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch, D. Severac: A non-iterative gate resizing algorithm for high reduction in power consumption. Integration 24(1): 37-52 (1997)
1996
10no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez: A Diagnostic ATPG for Delay Faults Based on Genetic Algorithms. ITC 1996: 286-293
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLS. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: A new test pattern generation method for delay fault testing. VTS 1996: 296-301
1995
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez: Diagnostic of path and gate delay faults in non-scan sequential circuits. VTS 1995: 380-386
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch: An advanced diagnostic method for delay faults in combinational faulty circuits. J. Electronic Testing 6(3): 277-294 (1995)
1994
6no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLD. Dumas, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis. EDAC-ETC-EUROASIC 1994: 518-523
1993
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLD. Dumas, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: An Implicit Delay-Fault Simulation Method with Approximate Detection Threshold Calculation. ITC 1993: 705-713
1992
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch: A Novel Approach to Delay-Fault Diagnosis. DAC 1992: 357-360
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPatrick Girard, Christian Landrault, Serge Pravossoudovitch: Delay-Fault Diagnosis by Critical-Path Tracing. IEEE Design & Test of Computers 9(4): 27-32 (1992)
1991
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMarie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch: Fault modeling and fault equivalence in CMOS technology. J. Electronic Testing 2(3): 229-241 (1991)
1990
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMarie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch: Fault modelling and fault equivalence in CMOS technology. EURO-DAC 1990: 407-412

Coauthor Index

1Nabil Badereddine [48] [49] [55] [65]
2Magali Bastian [50] [56] [57] [59] [60] [64] [66] [70] [74]
3Youssef Benabboud [71] [73]
4Paolo Bernardi [69] [72]
5Yannick Bonhomme [27] [28] [32] [33] [34] [37] [41] [42] [53]
6Simone Borri [36] [38] [43] [44] [45] [51]
7Alberto Bosio [62] [63] [67] [68] [69] [71] [72] [73]
8Laroussi Bouzaida [71] [73]
9Krishnendu Chakrabarty [65]
10Marylene Combe [54]
11S. Cremoux [9]
12Jean Michel Daga [54] [58] [61]
13René David [24] [26] [29] [31]
14Luigi Dilillo [36] [38] [43] [44] [45] [47] [50] [51] [56] [57] [73] [74]
15D. Dumas [5] [6]
16Christophe Fagot [9]
17Joan Figueras [17] [20]
18Marie-Lise Flottes [1] [2]
19A. Gabarró [20]
20O. Ginez [54] [58] [61]
21Patrick Girard [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [39] [40] [41] [42] [43] [44] [45] [46] [47] [48] [49] [50] [51] [52] [53] [54] [55] [56] [57] [58] [59] [60] [61] [62] [63] [64] [65] [66] [67] [68] [69] [70] [71] [72] [73] [74]
22Vincent Gouin [66] [70] [74]
23Loïs Guiller [16] [17] [18] [19] [20] [21] [23] [25] [27] [28] [34] [37] [41] [42] [53]
24Magali Bastian Hage-Hassan [43] [44] [45] [47] [51]
25Olivier Héron [35] [39] [40] [46] [52]
26Isabelle Izaute [71] [73]
27Christian Landrault [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [37] [41] [42] [48] [49] [53] [54] [55] [58] [59] [60] [61] [62] [63] [64] [65] [67] [68]
28M. Lopez [20]
29Salvador Manich [17] [20]
30V. Moreda [12] [14] [15]
31Alexandre Ney [59] [60] [64] [66] [70] [74]
32Michel Renovell [35] [39] [40] [46] [52]
33Matteo Sonza Reorda [72]
34B. Rodriguez [8] [10]
35Alexandre Rousset [62] [63] [68]
36M. Santos [17] [20]
37D. Severac [11] [13]
38P. Teixeira [17] [20]
39Julien Vial [67]
40Arnaud Virazel [14] [15] [22] [24] [26] [29] [30] [31] [36] [38] [41] [42] [43] [44] [45] [47] [48] [49] [50] [51] [53] [54] [55] [56] [57] [58] [59] [60] [61] [62] [63] [64] [65] [66] [67] [68] [70] [71] [73] [74]
41Zhanglei Wang [65]
42Hans-Joachim Wunderlich [25] [30] [55]

Copyright © Fri Nov 27 15:43:12 2009 by Michael Ley (ley@uni-trier.de)