 | 2009 |
|---|
| 8 |       | Ulf Schlichtmann,
Manuel Schmidt,
Harald Kinzelbach,
Michael Pronath,
Volker Glöckel,
Manfred Dietrich,
Uwe Eichler,
Joachim Haase:
Digital design at a crossroads How to make statistical design methodologies industrially relevant.
DATE 2009: 1542-1547 |
| 2008 |
|---|
| 7 | | Udo Sobe,
Karl-Heinz Rooch,
Andreas Ripp,
Michael Pronath:
Robust Analog Design for Automotive Applications by Design Centering with Safe Operating Areas.
ISQED 2008: 848-854 |
| 2006 |
|---|
| 6 | | Markus Bühler,
Jürgen Koehl,
Jeanne Bickford,
Jason Hibbeler,
Ulf Schlichtmann,
R. Sommer,
Michael Pronath,
Andreas Ripp:
DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design.
DATE 2006: 387-392 |
| 2003 |
|---|
| 5 | | Guido Stehr,
Michael Pronath,
Frank Schenkel,
Helmut E. Graeb,
Kurt Antreich:
Initial Sizing of Analog Integrated Circuits by Centering Within Topology-Given Implicit Specification.
ICCAD 2003: 241-246 |
| 2002 |
|---|
| 4 | | Robert Schwencker,
Frank Schenkel,
Michael Pronath,
Helmut E. Graeb:
Analog Circuit Sizing Using Adaptive Worst-Case Parameter Sets.
DATE 2002: 581-585 |
| 3 | | Michael Pronath,
Helmut E. Graeb,
Kurt Antreich:
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits.
DATE 2002: 78-83 |
| 2001 |
|---|
| 2 | | Frank Schenkel,
Michael Pronath,
Stephan Zizala,
Robert Schwencker,
Helmut E. Graeb,
Kurt Antreich:
Mismatch Analysis and Direct Yield Optimization by Spec-Wise Linearization and Feasibility-Guided Search.
DAC 2001: 858-863 |
| 2000 |
|---|
| 1 |  | Michael Pronath,
Volker Gloeckel,
Helmut E. Graeb:
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits.
ICCAD 2000: 557-561 |
