Bing Qiu

	2003
2		Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer: IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. DFT 2003: 18-25
	2002
1		Bing Qiu, Yvon Savaria, Meng Lu, Chunyan Wang, Claude Thibeault: Yield Modeling of a WSI Telecom Router Architecture. DFT 2002: 314-324

Coauthor Index

1	Meng Lu	[1] [2]
2	Yvon Savaria	[1] [2]
3	Jacques Taillefer	[2]
4	Claude Thibeault	[1]
5	Chunyan Wang	[1]