Krishna B. Rajan

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1996

2 Krishna B. Rajan, David E. Long, Miron Abramovici: Increasing testability by clock transformation (getting rid of those darn states). VTS 1996: 224-230

1992

1 Miron Abramovici, Krishna B. Rajan, David T. Miller: Freeze!: A New Approach for Testing Sequential Circuits. DAC 1992: 22-25

	1996
2		Krishna B. Rajan, David E. Long, Miron Abramovici: Increasing testability by clock transformation (getting rid of those darn states). VTS 1996: 224-230
	1992
1		Miron Abramovici, Krishna B. Rajan, David T. Miller: Freeze!: A New Approach for Testing Sequential Circuits. DAC 1992: 22-25

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