Michal Rakowski

	2008
2		Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz: Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC. DSD 2008: 729-734
	2007
1		Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A. Pleskacz, Michal Rakowski: Layout to Logic Defect Analysis for Hierarchical Test Generation. DDECS 2007: 35-40

Coauthor Index

1	Maksim Jenihhin	[1] [2]
2	Wieslaw Kuzmicz	[2]
3	Witold A. Pleskacz	[1] [2]
4	Jaan Raik	[1] [2]
5	Raimund Ubar	[1] [2]