J. M. Rampnoux

	2006
3		J. M. Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire: Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectronics Reliability 46(9-11): 1520-1524 (2006)
	2004
2		Josep Altet, J. M. Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby: Applications of temperature phase measurements to IC testing. Microelectronics Reliability 44(1): 95-103 (2004)
	2003
1		G. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)

Coauthor Index

1	Josep Altet	[2]
2	G. Andriamonje	[1]
3	Jean-Christophe Batsale	[2]
4	Wilfrid Claeys	[1] [2] [3]
5	Y. Danto	[1]
6	Stefan Dilhaire	[1] [2] [3]
7	Y. Ezzahri	[1]
8	Stéphane Grauby	[1] [2] [3]
9	D. Lewis	[1]
10	H. Michel	[3]
11	Y. Ousten	[1]
12	V. Pouget	[1]
13	Antonio Rubio	[2]
14	M. Amine Salhi	[3]