 | 2011 |
| 18 |  | Saibal Mukhopadhyay,
Rahul M. Rao,
Jae-Joon Kim,
Ching-Te Chuang:
SRAM Write-Ability Improvement With Transient Negative Bit-Line Voltage.
IEEE Trans. VLSI Syst. 19(1): 24-32 (2011) |
| 2010 |
| 17 |  | Jae-Joon Kim,
Rahul M. Rao,
Keunwoo Kim:
Technology-circuit co-design of asymmetric SRAM cells for read stability improvement.
CICC 2010: 1-4 |
| 16 |  | Harmander Singh,
Rahul M. Rao,
Kanak Agarwal,
Dennis Sylvester,
Richard B. Brown:
Dynamically Pulsed MTCMOS With Bus Encoding for Reduction of Total Power and Crosstalk Noise.
IEEE Trans. VLSI Syst. 18(1): 166-170 (2010) |
| 2009 |
| 15 |  | Amlan Ghosh,
Richard B. Brown,
Rahul M. Rao,
Ching-Te Chuang:
A Precise Negative Bias Temperature Instability Sensor using Slew-rate Monitor Circuitry.
ISCAS 2009: 381-384 |
| 14 |  | Amlan Ghosh,
Rahul M. Rao,
Richard B. Brown:
A centralized supply voltage and local body bias-based compensation approach to mitigate within-die process variation.
ISLPED 2009: 45-50 |
| 13 |  | Aditya Bansal,
Rahul M. Rao,
Jae-Joon Kim,
Sufi Zafar,
James H. Stathis,
Ching-Te Chuang:
Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability.
Microelectronics Reliability 49(6): 642-649 (2009) |
| 2008 |
| 12 |  | Saibal Mukhopadhyay,
Rahul M. Rao,
Jae-Joon Kim,
Ching-Te Chuang:
Capacitive coupling based transient negative bit-line voltage (Tran-NBL) scheme for improving write-ability of SRAM design in nanometer technologies.
ISCAS 2008: 384-387 |
| 11 |  | Amlan Ghosh,
Rahul M. Rao,
Ching-Te Chuang,
Richard B. Brown:
On-Chip Process Variation Detection and Compensation Using Delay and Slew-Rate Monitoring Circuits.
ISQED 2008: 815-820 |
| 10 |  | Amlan Ghosh,
Rahul M. Rao,
Jae-Joon Kim,
Ching-Te Chuang,
Richard B. Brown:
On-Chip Process Variation Detection Using Slew-Rate Monitoring Circuit.
VLSI Design 2008: 143-149 |
| 2007 |
| 9 |  | Kanak Agarwal,
Rahul M. Rao,
Dennis Sylvester,
Richard B. Brown:
Parametric Yield Analysis and Optimization in Leakage Dominated Technologies.
IEEE Trans. VLSI Syst. 15(6): 613-623 (2007) |
| 2005 |
| 8 |  | Rahul M. Rao,
Kanak Agarwal,
Dennis Sylvester,
Himanshu Kaul,
Richard B. Brown,
Sani R. Nassif:
Power-aware global signaling strategies.
ISCAS (1) 2005: 604-607 |
| 7 |  | Rahul M. Rao,
Kanak Agarwal,
Anirudh Devgan,
Kevin J. Nowka,
Dennis Sylvester,
Richard B. Brown:
Parametric Yield Analysis and Constrained-Based Supply Voltage Optimization.
ISQED 2005: 284-290 |
| 6 |  | Harmander Deogun,
Rahul M. Rao,
Dennis Sylvester,
Richard B. Brown,
Kevin J. Nowka:
Dynamically Pulsed MTCMOS with Bus Encoding for Total Power and Crosstalk Minimization.
ISQED 2005: 88-93 |
| 2004 |
| 5 |  | Rahul M. Rao,
Kanak Agarwal,
Dennis Sylvester,
Richard B. Brown,
Kevin J. Nowka,
Sani R. Nassif:
Approaches to run-time and standby mode leakage reduction in global buses.
ISLPED 2004: 188-193 |
| 4 |  | Rahul M. Rao,
Jeffrey L. Burns,
Richard B. Brown:
Analysis and Optimization of Enhanced MTCMOS Scheme.
VLSI Design 2004: 234-239 |
| 2003 |
| 3 |  | Rahul M. Rao,
Frank Liu,
Jeffrey L. Burns,
Richard B. Brown:
A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits.
ICCAD 2003: 689-692 |
| 2 |  | Rahul M. Rao,
Jeffrey L. Burns,
Anirudh Devgan,
Richard B. Brown:
Efficient techniques for gate leakage estimation.
ISLPED 2003: 100-103 |
| 1 |  | Emrah Acar,
Anirudh Devgan,
Rahul M. Rao,
Ying Liu,
Haihua Su,
Sani R. Nassif,
Jeffrey L. Burns:
Leakage and leakage sensitivity computation for combinational circuits.
ISLPED 2003: 96-99 |