Manu Rehani

	2004
3		W. Robert Daasch, Manu Rehani: Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428
2		Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw: ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. ITC 2004: 181-189
	2002
1		Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch: Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74

Coauthor Index

1	David Abercrombie	[2]
2	Kevin Cota	[1]
3	W. Robert Daasch	[1] [3]
4	Robert Madge	[1] [2]
5	Jason Saw	[2]
6	Jim Teisher	[2]