Robert Reuse

	1998
2		Lama Nachman, Kewal K. Saluja, Shambhu J. Upadhyaya, Robert Reuse: A Novel Approach to Random Pattern Testing of Sequential Circuits. IEEE Trans. Computers 47(1): 129-134 (1998)
	1996
1		Lama Nachman, Kewal K. Saluja, Shambhu J. Upadhyaya, Robert Reuse: Random Pattern Testing for Sequential Circuits Revisited. FTCS 1996: 44-52

Coauthor Index

1	Lama Nachman	[1] [2]
2	Kewal K. Saluja	[1] [2]
3	Shambhu J. Upadhyaya	[1] [2]