C. Ridgway

	2003
1		E. R. Davies, Michael Bateman, D. R. Mason, J. Chambers, C. Ridgway: Design of efficient line segment detectors for cereal grain inspection. Pattern Recognition Letters 24(1-3): 413-428 (2003)

Coauthor Index

1	Michael Bateman	[1]
2	J. Chambers	[1]
3	Edward Roy Davies (E. R. Davies)	[1]
4	D. R. Mason	[1]