Mike Rodgers

	2006
16		Ajay Khoche, Mike Rodgers, Pete O'Neil: Session Abstract. VTS 2006: 426
	2004
15		Don Edenfeld, Andrew B. Kahng, Mike Rodgers, Yervant Zorian: 2003 Technology Roadmap for Semiconductors. IEEE Computer 37(1): 47-56 (2004)
14		Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers: Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. IEEE Trans. on CAD of Integrated Circuits and Systems 23(5): 737-757 (2004)
	2003
13		Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers: March SL: A Test For All Static Linked Memory Faults. Asian Test Symposium 2003: 372-377
12		Said Hamdioui, A. J. van de Goor, Mike Rodgers: Detecting Intra-Word Faults in Word-Oriented Memories. VTS 2003: 241-247
11		Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers: Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. J. Electronic Testing 19(2): 195-205 (2003)
	2002
10		Said Hamdioui, A. J. van de Goor, Mike Rodgers: March SS: A Test for All Static Simple RAM Faults. MTDT 2002: 95-100
9		Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers: Debating the Future of Burn-In. VTS 2002: 311-314
8		Alan Allan, Don Edenfeld, William H. Joyner Jr., Andrew B. Kahng, Mike Rodgers, Yervant Zorian: 2001 Technology Roadmap for Semiconductors. IEEE Computer 35(1): 42-53 (2002)
	2001
7		Said Hamdioui, A. J. van de Goor, David Eastwick, Mike Rodgers: Detecting Unique Faults in Multi-port SRAMs. Asian Test Symposium 2001: 37-42
6		Said Hamdioui, A. J. van de Goor, David Eastwick, Mike Rodgers: Realistic Fault Models and Test Procedures for Multi-Port SRAMs. MTDT 2001: 65-72
5		Mike Rodgers: ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing. VTS 2001: 155-157
	2000
4		Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy: Test challenges for deep sub-micron technologies. DAC 2000: 142-149
3		Yervant Zorian, Sujit Dey, Mike Rodgers: Test of Future System-on-Chips. ICCAD 2000: 392-398
2		Mike Rodgers: Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors. ITC 2000: 464-467
1		Said Hamdioui, A. J. van de Goor, Mike Rodgers, David Eastwick: March Tests for Realistic Faults in Two-Port Memories. MTDT 2000: 73-78

Coauthor Index

1	Zaid Al-Ars	[11] [13] [14]
2	Alan Allan	[8]
3	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[4]
4	Sujit Dey	[3] [4]
5	David Eastwick	[1] [6] [7]
6	Don Edenfeld	[8] [15]
7	A. J. van de Goor	[1] [6] [7] [10] [11] [12] [13] [14]
8	Said Hamdioui	[1] [6] [7] [10] [11] [12] [13] [14]
9	William H. Joyner Jr.	[8]
10	Andrew B. Kahng	[8] [15]
11	Ajay Khoche	[16]
12	Bob Madge	[9]
13	Peter C. Maxwell	[9]
14	Edward J. McCluskey	[9]
15	Subhasish Mitra	[9]
16	Phil Nigh	[9]
17	Pete O'Neil	[16]
18	Kaushik Roy	[4]
19	Yervant Zorian	[3] [8] [15]