R. Rodríguez Coauthor index DBLP Vis pubzone.org

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10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLGeorges G. E. Gielen, P. De Wit, Elie Maricau, J. Loeckx, J. Martin-Martinez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327
2006
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLEva M. Ortigosa, Antonio Cañas, R. Rodríguez, Javier Díaz, Sonia Mota: Towards an Optimal Implementation of MLP in FPGA. ARC 2006: 46-51
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Fernández, R. Rodríguez, M. Nafría, X. Aymerich, Ben Kaczer, Guido Groeseneken: FinFET and MOSFET preliminary comparison of gate oxide reliability. Microelectronics Reliability 46(9-11): 1608-1611 (2006)
2005
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Fernández, R. Rodríguez, M. Nafría, X. Aymerich: Influence of oxide breakdown position and device aspect ratio on MOSFET's output characteristics. Microelectronics Reliability 45(5-6): 861-864 (2005)
2003
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJames H. Stathis, R. Rodríguez, Barry P. Linder: Circuit implications of gate oxide breakdown. Microelectronics Reliability 43(8): 1193-1197 (2003)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJames H. Stathis, Barry P. Linder, R. Rodríguez, Salvatore Lombardo: Reliability of ultra-thin oxides in CMOS circuits. Microelectronics Reliability 43(9-11): 1353-1360 (2003)
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Rodríguez, James H. Stathis, Barry P. Linder, Rajiv V. Joshi, Ching-Te Chuang: Influence and model of gate oxide breakdown on CMOS inverters. Microelectronics Reliability 43(9-11): 1439-1444 (2003)
2002
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo: Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectronics Reliability 42(9-11): 1445-1448 (2002)
2001
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. Rodríguez, M. Porti, M. Nafría, X. Aymerich: Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO2 films. Microelectronics Reliability 41(7): 1011-1013 (2001)
1999
1no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLR. G. Durán, L. Hervella-Nieto, E. Liberman, R. Rodríguez, J. Solomin: Approximation of the vibration modes of a plate by Reissner-Mindlin equations. Math. Comput. 68(228): 1447-1463 (1999)

Coauthor Index

1X. Aymerich [2] [7] [8]
2Kerry Bernstein [3]
3A. J. Bhavnagarwala [3]
4Antonio Cañas (Antonio Cañas Vargas) [9]
5Ching-Te Chuang [3] [4]
6Javier Díaz [9]
7R. G. Durán [1]
8R. Fernández [7] [8]
9Georges G. E. Gielen [10]
10Guido Groeseneken [8] [10]
11L. Hervella-Nieto [1]
12Rajiv V. Joshi [3] [4]
13Ben Kaczer [8] [10]
14S. Kowalczyk [3]
15E. Liberman [1]
16Barry P. Linder [3] [4] [5] [6]
17J. Loeckx [10]
18Salvatore Lombardo [3] [5]
19Elie Maricau [10]
20J. Martin-Martinez [10]
21Sonia Mota [9]
22M. Nafría [2] [7] [8] [10]
23Gregory A. Northrop [3]
24Eva M. Ortigosa [9]
25M. Porti [2]
26J. Solomin [1]
27James H. Stathis [3] [4] [5] [6]
28P. De Wit [10]

Colors in the list of coauthors

Copyright © Fri Dec 4 16:04:45 2009 by Michael Ley (ley@uni-trier.de)