Ph. Roussel

	2005
1		Y.-L. Li, Zs. Tökei, Ph. Roussel, Guido Groeseneken, Karen Maex: Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectronics Reliability 45(9-11): 1299-1304 (2005)

Coauthor Index

1	Guido Groeseneken	[1]
2	Y.-L. Li	[1]
3	Karen Maex	[1]
4	Zs. Tökei	[1]