| 2012 | ||
|---|---|---|
| 23 | Ronny Lempel, Ronen Barenboim, Edward Bortnikov, Nadav Golbandi, Amit Kagian, Liran Katzir, Hayim Makabee, Scott Roy, Oren Somekh: Hierarchical composable optimization of web pages. WWW (Companion Volume) 2012: 53-62 | |
| 2011 | ||
| 22 | Michael Merrett, P. Asenov, Yangang Wang, Mark Zwolinski, Dave Reid, Campbell Millar, Scott Roy, Zhenyu Liu, Stephen B. Furber, Asen Asenov: Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. DATE 2011: 1537-1540 | |
| 21 | Feng Hong, Binjie Cheng, Scott Roy, David R. S. Cumming: An analytical mismatch model of nano-CMOS device under impact of intrinsic device variability. ISCAS 2011: 2257-2260 | |
| 20 | Ronen Barenboim, Edward Bortnikov, Nadav Golbandi, Amit Kagian, Liran Katzir, Ronny Lempel, Hayim Makabee, Scott Roy, Oren Somekh: Hierarchical Composable Optimization of Web Pages CoRR abs/1110.0704: (2011) | |
| 19 | James Alfred Walker, James A. Hilder, Dave Reid, Asen Asenov, Scott Roy, Campbell Millar, Andy M. Tyrrell: The evolution of standard cell libraries for future technology nodes. Genetic Programming and Evolvable Machines 12(3): 235-256 (2011) | |
| 2010 | ||
| 18 | Asen Asenov, Binjie Cheng, Daryoosh Dideban, Urban Kovac, Negin Moezi, Campbell Millar, Gareth Roy, Andrew R. Brown, Scott Roy: Modeling and simulation of transistor and circuit variability and reliability. CICC 2010: 1-8 | |
| 17 | Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov: Capturing intrinsic parameter fluctuations using the PSP compact model. DATE 2010: 650-653 | |
| 16 | Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov: Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. IEEE Design & Test of Computers 27(2): 26-35 (2010) | |
| 15 | Jane Magill, Scott Roy: Chips for Everyone: A Multifaceted Approach in Electrical Engineering Outreach. IEEE Trans. Education 53(1): 114-119 (2010) | |
| 14 | Tong Boon Tang, Alan F. Murray, Scott Roy: Methodology of Statistical RTS Noise Analysis With Charge-Carrier Trapping Models. IEEE Trans. on Circuits and Systems 57-I(5): 1062-1070 (2010) | |
| 2009 | ||
| 13 | Derek Graham, Per Strid, Scott Roy, Fernando Rodriguez: A low-tech solution to avoid the severe impact of transient errors on the IP interconnect. DSN 2009: 478-483 | |
| 12 | Noor Ain Kamsani, Binjie Cheng, Scott Roy, Asen Asenov: Impact of Random Dopant Induced Statistical Variability on Inverter Switching Trajectories and Timing Variability. ISCAS 2009: 577-580 | |
| 11 | Asen Asenov, Dave Reid, Campbell Millar, Scott Roy, Gareth Roy, Richard O. Sinnott, Gordon Stewart, Graeme Stewart: Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. LSSC 2009: 369-378 | |
| 2008 | ||
| 10 | Richard O. Sinnott, Christopher Bayliss, Thomas Doherty, David Martin, Campbell Millar, Gordon Stewart, John P. Watt, Asen Asenov, Gareth Roy, Scott Roy, C. Davenhall, B. Harbulot, M. Jones: Integrating Security Solutions to Support nanoCMOS Electronics Research. ISPA 2008: 71-79 | |
| 9 | Deepak Agarwal, Bee-Chung Chen, Pradheep Elango, Nitin Motgi, Seung-Taek Park, Raghu Ramakrishnan, Scott Roy, Joe Zachariah: Online Models for Content Optimization. NIPS 2008: 17-24 | |
| 8 | Richard O. Sinnott, Christopher Bayliss, C. Davenhall, B. Harbulot, M. Jones, Campbell Millar, Gareth Roy, Scott Roy, Gordon Stewart, John P. Watt, Asen Asenov: Secure, Performance-Oriented Data Management for nanoCMOS Electronics. eScience 2008: 87-94 | |
| 7 | Nor Hisham Hamid, Alan F. Murray, Scott Roy: Time-Domain Modeling of Low-Frequency Noise in Deep-Submicrometer MOSFET. IEEE Trans. on Circuits and Systems 55-I(1): 245-257 (2008) | |
| 6 | Muhammad Faiz Bukhori, Scott Roy, Asen Asenov: Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants. Microelectronics Reliability 48(8-9): 1549-1552 (2008) | |
| 5 | Urban Kovac, Dave Reid, Campbell Millar, Gareth Roy, Scott Roy, Asen Asenov: Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. Microelectronics Reliability 48(8-9): 1572-1575 (2008) | |
| 2007 | ||
| 4 | Liangxiu Han, Asen Asenov, Dave Berry, Campbell Millar, Gareth Roy, Scott Roy, Richard O. Sinnott, Gordon Stewart: Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics. eScience 2007: 305-311 | |
| 2005 | ||
| 3 | Nor Hisham Hamid, Alan F. Murray, David I. Laurenson, Scott Roy, Binjie Cheng: Probabilistic computing with future deep sub-micrometer devices: a modelling approach. ISCAS (3) 2005: 2510-2513 | |
| 2004 | ||
| 2 | L. Yang, Asen Asenov, J. R. Watling, M. Boriçi, J. R. Barker, Scott Roy, K. Elgaid, I. Thayne, T. Hackbarth: Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs. Microelectronics Reliability 44(7): 1101-1107 (2004) | |
| 1996 | ||
| 1 | Scott Roy, Asen Asenov, J. R. Barker: Optimum partitioning of topologically rectangular grids. EUROSIM 1996: 179-185 | |
Colors in the list of coauthors
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