Come Rozon

	2006
14		Hussam Al-Hertani, Dhamin Al-Khalili, Come Rozon: Accurate Total Static Leakage Current Estimation in Transistor Stacks. AICCSA 2006: 262-265
13		Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries. Integration 39(4): 382-406 (2006)
	2005
12		Hussam Al-Hertani, Dhamin Al-Khalili, Come Rozon: Leakage power dissipation in UDSM logic gates. Circuits, Signals, and Systems 2005: 132-136
	2003
11		Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: IC Bridge Fault Modeling for IP Blocks Using Neural Network-Based VHDL Saboteurs. IEEE Trans. Computers 52(10): 1285-1297 (2003)
	2002
10		Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models. Integration 32(1-2): 77-97 (2002)
	2001
9		Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Accurate CMOS Bridge Fault Modeling with Neural Network-Based VHDL Saboteurs. ICCAD 2001: 531-536
8		Donald B. Shaw, Dhamin Al-Khalili, Come Rozon: Deriving accurate ASIC cell fault models for VITAL compliant VHDL simulation. ISCAS (5) 2001: 263-266
	1998
7		Jason Coppens, Dhamin Al-Khalili, Come Rozon: VHDL Modelling and Analysis of Fault Secure Systems. DATE 1998: 148-152
6		Dhamin Al-Khalili, Saman Adham, Come Rozon, Moazzem Hossain, D. Racz: Comprehensive Defect Analysis and Defect Coverage of CMOS Circuits. DFT 1998: 84-92
	1996
5		Come Rozon: On the Use of VHDL as a Multi-Valued Logic Simulator. ISMVL 1996: 110-
	1995
4		D. B. Gravel, Germain Drolet, Come Rozon: Improved VLSI Design for Decoding Concatenated Codes Comprising an Irreducible Cyclic Code and a Reed-Solomon Code. Information Theory and Applications 1995: 104-110
	1993
3		Michael Ogbonna Esonu, Dhamin Al-Khalili, Come Rozon: Fault Characterization and Testability Analysis of Emitter Coupled Logic and Comparison with CMOS & BiCMOS Circuits. ISCAS 1993: 1714-1717
	1992
2		Dhamin Al-Khalili, Come Rozon, B. Stewart: Testability analysis and fault modeling of BiCMOS circuits. J. Electronic Testing 3(3): 207-217 (1992)
	1991
1		Come Rozon, H. T. Mouftah: Testability Analysis of CMOS Temary Circuits. ISMVL 1991: 158-165

Coauthor Index

1	Saman Adham	[6]
2	Hussam Al-Hertani	[12] [14]
3	Dhamin Al-Khalili	[2] [3] [6] [7] [8] [9] [10] [11] [12] [13] [14]
4	Jason Coppens	[7]
5	Germain Drolet	[4]
6	Michael Ogbonna Esonu	[3]
7	D. B. Gravel	[4]
8	Moazzem Hossain	[6]
9	H. T. Mouftah (Hussein T. Mouftah)	[1]
10	D. Racz	[6]
11	Donald B. Shaw	[8] [9] [10] [11] [13]
12	B. Stewart	[2]

Colors in the list of coauthors