Jens Ruffler

	2004
2		Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler: In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212
1		Chris Schuermyer, Jens Ruffler, W. Robert Daasch: Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308

Coauthor Index

1	Brady Benware	[2]
2	W. Robert Daasch	[1] [2]
3	Robert Madge	[2]
4	Chris Schuermyer	[1] [2]
5	Ritesh P. Turakhia	[2]