Jee-Youl Ryu

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2006

3 Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla: A Novel RF Test Scheme Based on a DFT Method. J. Electronic Testing 22(3): 229-237 (2006)

2005

2 Jee-Youl Ryu, Bruce C. Kim: Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. J. Electronic Testing 21(6): 571-581 (2005)

1 Jee-Youl Ryu, Bruce C. Kim: Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. Microelectronics Journal 36(8): 770-777 (2005)

	2006
3		Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla: A Novel RF Test Scheme Based on a DFT Method. J. Electronic Testing 22(3): 229-237 (2006)
	2005
2		Jee-Youl Ryu, Bruce C. Kim: Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. J. Electronic Testing 21(6): 571-581 (2005)
1		Jee-Youl Ryu, Bruce C. Kim: Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. Microelectronics Journal 36(8): 770-777 (2005)

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