Yoriyuki Sakamoto

	1997
1		Kazumi Hatayama, Mitsuji Ikeda, Masahiro Takakura, Satoshi Uchiyama, Yoriyuki Sakamoto: Application of a Design for Delay Testability Approach to High Speed Logic LSIs. Asian Test Symposium 1997: 112-115

Coauthor Index

1	Kazumi Hatayama	[1]
2	Mitsuji Ikeda	[1]
3	Masahiro Takakura	[1]
4	Satoshi Uchiyama	[1]