 | 2009 |
|---|
| 12 |       | Alodeep Sanyal,
Abhisek Pan,
Sandip Kundu:
A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits.
ACM Great Lakes Symposium on VLSI 2009: 529-534 |
| 11 | | Alodeep Sanyal,
Abhisek Pan,
Sandip Kundu:
A study on impact of loading effect on capacitive crosstalk noise.
ISQED 2009: 696-701 |
| 10 | | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
An Improved Soft-Error Rate Measurement Technique.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 596-600 (2009) |
| 2008 |
|---|
| 9 | | Aswin Sreedhar,
Alodeep Sanyal,
Sandip Kundu:
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits.
DATE 2008: 616-621 |
| 8 | | Alodeep Sanyal,
Sandip Kundu:
A Built-in Test and Characterization Method for Circuit Marginality Related Failures.
ISQED 2008: 838-843 |
| 7 | | Ashesh Rastogi,
Kunal P. Ganeshpure,
Alodeep Sanyal,
Sandip Kundu:
On Composite Leakage Current Maximization.
J. Electronic Testing 24(4): 405-420 (2008) |
| 2007 |
|---|
| 6 | | Alodeep Sanyal,
Sandip Kundu:
On Derating Soft Error Probability Based on Strength Filtering.
IOLTS 2007: 152-160 |
| 5 | | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
Accelerating Soft Error Rate Testing Through Pattern Selection.
IOLTS 2007: 191-193 |
| 4 | | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
On Accelerating Soft-Error Detection by Targeted Pattern Generation.
ISQED 2007: 723-728 |
| 3 | | Ashesh Rastogi,
Wei Chen,
Alodeep Sanyal,
Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect.
VLSI Design 2007: 583-588 |
| 2006 |
|---|
| 2 | | Kunal P. Ganeshpure,
Alodeep Sanyal,
Sandip Kundu:
A Pattern Generation Technique for Maximizing Power Supply Currents.
ICCD 2006 |
| 2005 |
|---|
| 1 | | Artem Sokolov,
Alodeep Sanyal,
L. Darrell Whitley,
Yashwant K. Malaiya:
Dynamic power minimization during combinational circuit testing as a traveling salesman problem.
Congress on Evolutionary Computation 2005: 1088-1095 |
