Yoichi Sasaki

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2008

2 Yoichi Sasaki, Kazuteru Namba, Hideo Ito: Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger. J. Electronic Testing 24(1-3): 11-19 (2008)

2006

1 Yoichi Sasaki, Kazuteru Namba, Hideo Ito: Soft Error Masking Circuit and Latch Using Schmitt Trigger Circuit. DFT 2006: 327-335

	2008
2		Yoichi Sasaki, Kazuteru Namba, Hideo Ito: Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger. J. Electronic Testing 24(1-3): 11-19 (2008)
	2006
1		Yoichi Sasaki, Kazuteru Namba, Hideo Ito: Soft Error Masking Circuit and Latch Using Schmitt Trigger Circuit. DFT 2006: 327-335

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