Yoshimichi Satoh

	1996
1		Nobuyasu Kanekawa, Makoto Nohmi, Yoshimichi Satoh, Hiroshi Satoh: Self-Checking and Fail-Safe LSIs by Intra-Chip Redundancy. FTCS 1996: 426-430

Coauthor Index

1	Nobuyasu Kanekawa	[1]
2	Makoto Nohmi	[1]
3	Hiroshi Satoh	[1]