Michael H. Schulz

	1992
13		Franz Fink, Karl Fuchs, Michael H. Schulz: Robust and Nonrobust Path Delay Fault Simulation by Parallel Processing of Patterns. IEEE Trans. Computers 41(12): 1527-1536 (1992)
12		Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler: A hierarchical test pattern generation system based on high-level primitives. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 34-44 (1992)
11		Hans-Joachim Wunderlich, Michael H. Schulz: Prüfgerechter Entwurf und Test hochintegrierter Schaltungen. Informatik Spektrum 15(1): 23-32 (1992)
	1991
10		Elisabeth Auth, Michael H. Schulz: A Test-Pattern-Generation Algorithm for Sequential Circuits. IEEE Design & Test of Computers 8(2): 72-86 (1991)
9		Karl Fuchs, Franz Fink, Michael H. Schulz: DYNAMITE: an efficient automatic test pattern generation system for path delay faults. IEEE Trans. on CAD of Integrated Circuits and Systems 10(10): 1323-1335 (1991)
	1990
8		Bernhard H. Seiß, Michael H. Schulz: Ein neues, effizientes Verfahren zum Testpunkteeinbau in kombinatorischen Schaltungen. Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme 1990: 195-206
	1989
7		Michael H. Schulz, Franz Fink, Karl Fuchs: Parallel Pattern Fault Simulation of Path Delay Faults. DAC 1989: 357-363
6		Michael H. Schulz, Elisabeth Auth: Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. ITC 1989: 28-37
5		Thomas M. Sarfert, Remo G. Markgraf, Erwin Trischler, Michael H. Schulz: Hierarchical Test Pattern Generation Based on High-Level Primitives. ITC 1989: 470-479
4		Michael H. Schulz, Elisabeth Auth: Improved deterministic test pattern generation with applications to redundancy identification. IEEE Trans. on CAD of Integrated Circuits and Systems 8(7): 811-816 (1989)
	1988
3		Michael H. Schulz: Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität Springer 1988
2		Michael H. Schulz, Erwin Trischler, Thomas M. Sarfert: SOCRATES: a highly efficient automatic test pattern generation system. IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 126-137 (1988)
	1987
1		Kurt Antreich, Michael H. Schulz: Accelerated Fault Simulation and Fault Grading in Combinational Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 6(5): 704-712 (1987)

Coauthor Index

1	Kurt Antreich	[1]
2	Elisabeth Auth	[4] [6] [10]
3	Franz Fink	[7] [9] [13]
4	Karl Fuchs	[7] [9] [13]
5	Remo G. Markgraf	[5] [12]
6	Thomas M. Sarfert	[2] [5] [12]
7	Bernhard H. Seiß	[8]
8	Erwin Trischler	[2] [5] [12]
9	Hans-Joachim Wunderlich	[11]

Colors in the list of coauthors