C. Sebeke

	2006
1		C. Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Göhner: Test and reliability challenges in automotive microelectronics. DATE 2006: 547

Coauthor Index

1	S. Fuchs	[1]
2	Peter Göhner	[1]
3	Klaus Harbich	[1]
4	C. Jung	[1]
5	J. Schwarz	[1]