Janusz H. C. Sedlacek

	1997
1		Mordechai Rothschild, Anthony R. Forte, Roderick R. Kunz, Susan C. Palmateer, Janusz H. C. Sedlacek: Lithography at a wavelength of 193 nm. IBM Journal of Research and Development 41(1&2): 49-56 (1997)

Coauthor Index

1	Anthony R. Forte	[1]
2	Roderick R. Kunz	[1]
3	Susan C. Palmateer	[1]
4	Mordechai Rothschild	[1]