D. Chandra Sekhar

	2004
2		M. M. De Souza, S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Prasad Chaparala: Influence of mobility model on extraction of stress dependent source-drain series resistance. Microelectronics Reliability 44(1): 25-32 (2004)
	2003
1		S. K. Manhas, D. Chandra Sekhar, A. S. Oates, M. M. De Souza: Characterisation of series resistance degradation through charge pumping technique. Microelectronics Reliability 43(4): 617-624 (2003)

Coauthor Index

1	Prasad Chaparala	[2]
2	S. K. Manhas	[1] [2]
3	A. S. Oates	[1] [2]
4	M. M. De Souza	[1] [2]