Kazuma Sekiya

	2001
1		Reza Aghaeizadeh Zoroofi, Hisashi Taketani, Shinichi Tamura, Yoshinobu Sato, Kazuma Sekiya: Automated inspection of IC wafer contamination. Pattern Recognition 34(6): 1307-1317 (2001)

Coauthor Index

1	Yoshinobu Sato	[1]
2	Hisashi Taketani	[1]
3	Shinichi Tamura	[1]
4	Reza Aghaeizadeh Zoroofi	[1]