Sharad C. Seth

	2009
54		Ramana C. Jandhyala, Mukkai S. Krishnamoorthy, George Nagy, Raghav K. Padmanabhan, Sharad C. Seth, William Silversmith: From Tessellations to Table Interpretation. Calculemus/MKM 2009: 422-437
53		George Nagy, Sharad C. Seth, Mahesh Viswanathan: Comment: Projection Methods Require Black Border Removal. IEEE Trans. Pattern Anal. Mach. Intell. 31(4): 762 (2009)
	2008
52		Jian Kang, Sharad C. Seth, Yi-Shing Chang, Vijay Gangaram: Efficient Selection of Observation Points for Functional Tests. ISQED 2008: 236-241
51		Sharad C. Seth, Ashok Samal: Conflation of Features. Encyclopedia of GIS 2008: 129-133
50		Ashok Samal, Sharad C. Seth: Feature Extraction, Abstract. Encyclopedia of GIS 2008: 314-320
49		Indranil Saha, Bhargab B. Bhattacharya, Sheng Zhang, Sharad C. Seth: Planar Straight-Line Embedding of Double-Tree Scan Architecture on a Rectangular Grid. Fundam. Inform. 89(2-3): 331-344 (2008)
	2007
48		Jian Kang, Sharad C. Seth, Vijay Gangaram: Efficient RTL Coverage Metric for Functional Test Selection. VTS 2007: 318-324
	2006
47		Ashutosh Joshi, George Nagy, Daniel P. Lopresti, Sharad C. Seth: A Maximum-Likelihood Approach to Symbolic Indirect Correlation. ICPR (3) 2006: 99-103
	2005
46		Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattacharya: Efficient Test Compaction for Pseudo-Random Testing. Asian Test Symposium 2005: 337-342
45		Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattacharya: On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design. VLSI Design 2005: 491-496
	2004
44		George Nagy, Ashutosh Joshi, Mukkai S. Krishnamoorthy, Yu Lin, Daniel P. Lopresti, Shashank K. Mehta, Sharad C. Seth: A nonparametric classifier for unsegmented text. DRR 2004: 102-108
43		Ashok Samal, Sharad C. Seth, Kevin Cueto: A feature-based approach to conflation of geospatial sources. International Journal of Geographical Information Science 18(5): 459-489 (2004)
	2003
42		Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang: Double-Tree Scan: A Novel Low-Power Scan-Path Architecture. ITC 2003: 470-479
41		Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zhang: Low-Energy BIST Design for Scan-based Logic Circuits. VLSI Design 2003: 546-551
40		Hailong Cui, Sharad C. Seth, Shashank K. Mehta: Modeling Fault Coverage of Random Test Patterns. J. Electronic Testing 19(3): 271-284 (2003)
	2002
39		Hailong Cui, Sharad C. Seth, Shashank K. Mehta: A Novel Method to Improve the Test Efficiency of VLSI Tests. VLSI Design 2002: 499-504
	2001
38		Don Sylwester, Sharad C. Seth: Adaptive Segmentation of Document Images. ICDAR 2001: 827-831
37		Mark W. Weiss, Sharad C. Seth, Shashank K. Mehta, Kent L. Einspahr: Design Verification and Functional Testing of FiniteState Machines. VLSI Design 2001: 189-195
	2000
36		Mark W. Weiss, Sharad C. Seth, Shashank K. Mehta, Kent L. Einspahr: Exploiting don't cares to enhance functional tests. ITC 2000: 538-546
35		Luyang Li, George Nagy, Ashok Samal, Sharad C. Seth, Yihong Xu: Integrated text and line-art extraction from a topographic map. IJDAR 2(4): 177-185 (2000)
	1999
34		Luyang Li, George Nagy, Ashok Samal, Sharad C. Seth, Yihong Xu: Cooperative Text and Line-Art Extraction from a Topographic Map. ICDAR 1999: 467-470
33		Shashank K. Mehta, Sharad C. Seth: Empirical Computation of Reject Ratio in VLSI Testing. VLSI Design 1999: 506-511
32		Kent L. Einspahr, Shashank K. Mehta, Sharad C. Seth: A synthesis for testability scheme for finite state machines using clock control. IEEE Trans. on CAD of Integrated Circuits and Systems 18(12): 1780-1792 (1999)
	1998
31		Kent L. Einspahr, Shashank K. Mehta, Sharad C. Seth: Synthesis of Sequential Circuits with Clock Control to Improve Testability. Asian Test Symposium 1998: 472-
30		Vishwani D. Agrawal, Sharad C. Seth: Mutually Disjoint Signals and Probability Calculation in Digital Circuits. Great Lakes Symposium on VLSI 1998: 307-312
	1997
29		George Nagy, Ashok Samal, Sharad C. Seth, T. Fisher, E. Guthmann, K. Kalafala, Luyang Li, Prateek Sarkar, S. Sivasubramaniam, Yihong Xu: A Prototype for Adaptive Association of Street Names with Streets on Maps. GREC 1997: 302-313
28		Shashank K. Mehta, Kent L. Einspahr, Sharad C. Seth: Synthesis for Testability by Two-Clock Control. VLSI Design 1997: 279-283
	1996
27		Kent L. Einspahr, Sharad C. Seth, Vishwani D. Agrawal: Improving Circuit Testability by Clock Control. Great Lakes Symposium on VLSI 1996: 288-293
	1995
26		Stephen D. Scott, Ashok Samal, Sharad C. Seth: HGA: A Hardware-Based Genetic Algorithm. FPGA 1995: 53-59
25		Don Sylwester, Sharad C. Seth: A trainable, single-pass algorithm for column segmentation. ICDAR 1995: 615-618
24		Yuhong Yu, Ashok Samal, Sharad C. Seth: A system for recognizing a large class of engineering drawings. ICDAR 1995: 791-794
23		S. Venkatraman, Sharad C. Seth, Prathima Agrawal: Parallel test generation with low communication overhead. VLSI Design 1995: 116-120
22		N. Ranganathan, Sharad C. Seth: Conference Reports. IEEE Design & Test of Computers 12(2): 5, 81 (1995)
21		Kent L. Einspahr, Sharad C. Seth: A switch-level test generation system for synchronous and asynchronous circuits. J. Electronic Testing 6(1): 59-73 (1995)
	1994
20		Sharad C. Seth, Lee Gowen, Matt Payne, Don Sylwester: Logic Simulation Using an Asynchronous Parallel Discrete-Event Simulation Model on a SIMD Machine. VLSI Design 1994: 29-32
19		Yuhong Yu, Ashok Samal, Sharad C. Seth: Isolating symbols from connection lines in a class of engineering drawings. Pattern Recognition 27(3): 391-404 (1994)
	1993
18		Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth: Generating Tests for Delay Faults in Nonscan Circuits. IEEE Design & Test of Computers 10(1): 20-28 (1993)
17		Mukkai S. Krishnamoorthy, George Nagy, Sharad C. Seth, Mahesh Viswanathan: Syntactic Segmentation and Labeling of Digitized Pages from Technical Journals. IEEE Trans. Pattern Anal. Mach. Intell. 15(7): 737-747 (1993)
16		D. Das, Sharad C. Seth, Vishwani D. Agrawal: Accurate computation of field reject ratio based on fault latency. IEEE Trans. VLSI Syst. 1(4): 537-545 (1993)
	1992
15		George Nagy, Sharad C. Seth, Mahesh Viswanathan: A Prototype Document Image Analysis System for Technical Journals. IEEE Computer 25(7): 10-22 (1992)
	1991
14		Dharam Vir Das, Sharad C. Seth, Vishwani D. Agrawal: Estimating the Quality of Manufactured Digital Sequential Circuits. ITC 1991: 210-217
	1990
13		Paul Kenyon, Prathima Agrawal, Sharad C. Seth: High-level microprogramming: an optimizing C compiler for a processing element of a CAD accelerator. MICRO 1990: 97-106
12		Sharad C. Seth, Vishwani D. Agrawal, Hassan Farhat: A Statistical Theory of Digital Circuit Testability. IEEE Trans. Computers 39(4): 582-586 (1990)
	1989
11		Raghu V. Hudli, Sharad C. Seth: Testability Analysis of Synchronous Sequential Circuits Based on Structural Data. ITC 1989: 364-372
10		Lester Lipsky, Sharad C. Seth: Signal Probabilities in AND-OR Trees. IEEE Trans. Computers 38(11): 1558-1563 (1989)
9		Bhargab B. Bhattacharya, Sharad C. Seth: Design of Parity Testable Combinational Circuits. IEEE Trans. Computers 38(11): 1580-1584 (1989)
	1985
8		Sharad C. Seth: Predicting Fault Coverage from Probabilistic Testability. ITC 1985: 803-807
	1984
7		Ten-Chuan Hsiao, Sharad C. Seth: An Analysis of the Use of Rademacher-Walsh Spectrum in Compact Testing. IEEE Trans. Computers 33(10): 934-937 (1984)
6		Sharad C. Seth, Vishwani D. Agrawal: Characterizing the LSI Yield Equation from Wafer Test Data. IEEE Trans. on CAD of Integrated Circuits and Systems 3(2): 123-126 (1984)
	1983
5		Sharad C. Seth, Lester Lipsky: A Simplified Method to Calculate Failure Times in Fault-Tolerant Systems. IEEE Trans. Computers 32(8): 754-760 (1983)
	1981
4		Sharad C. Seth, K. Narayanaswamy: A Graph Model for Pattern-Sensitive Faults in Random Access Memories. IEEE Trans. Computers 30(12): 973-977 (1981)
	1978
3		Kolar L. Kodandapani, Sharad C. Seth: On Combinational Networks with Restricted Fan-Out. IEEE Trans. Computers 27(4): 309-318 (1978)
	1977
2		Sharad C. Seth, Kolar L. Kodandapani: Diagnosis of Faults in Linear Tree Networks. IEEE Trans. Computers 26(1): 29-33 (1977)
1		James M. Steckelberg, Sharad C. Seth: On a Relation Between Algebraic Programs and Turing Machines. Inf. Process. Lett. 6(6): 180-183 (1977)

Coauthor Index

1	Prathima Agrawal	[13] [18] [23]
2	Vishwani D. Agrawal	[6] [12] [14] [16] [18] [27] [30]
3	Bhargab B. Bhattacharya	[9] [41] [42] [45] [46] [49]
4	Yi-Shing Chang	[52]
5	Kevin Cueto	[43]
6	Hailong Cui	[39] [40]
7	D. Das	[16]
8	Dharam Vir Das	[14]
9	Kent L. Einspahr	[21] [27] [28] [31] [32] [36] [37]
10	Hassan Farhat	[12]
11	T. Fisher	[29]
12	Vijay Gangaram	[48] [52]
13	Lee Gowen	[20]
14	E. Guthmann	[29]
15	Ten-Chuan Hsiao	[7]
16	Raghu V. Hudli	[11]
17	Ramana C. Jandhyala	[54]
18	Ashutosh Joshi	[44] [47]
19	K. Kalafala	[29]
20	Jian Kang	[48] [52]
21	Paul Kenyon	[13]
22	Kolar L. Kodandapani	[2] [3]
23	Mukkai S. Krishnamoorthy	[17] [44] [54]
24	Luyang Li	[29] [34] [35]
25	Yu Lin	[44]
26	Lester Lipsky	[5] [10]
27	Daniel P. Lopresti	[44] [47]
28	Shashank K. Mehta	[28] [31] [32] [33] [36] [37] [39] [40] [44]
29	George Nagy	[15] [17] [29] [34] [35] [44] [47] [53] [54]
30	K. Narayanaswamy	[4]
31	Raghav K. Padmanabhan	[54]
32	Matt Payne	[20]
33	N. Ranganathan (Nagarajan Ranganathan)	[22]
34	Indranil Saha	[49]
35	Ashok Samal	[19] [24] [26] [29] [34] [35] [43] [50] [51]
36	Prateek Sarkar	[29]
37	Stephen D. Scott	[26]
38	William Silversmith	[54]
39	S. Sivasubramaniam	[29]
40	James M. Steckelberg	[1]
41	Don Sylwester	[20] [25] [38]
42	S. Venkatraman	[23]
43	Mahesh Viswanathan	[15] [17] [53]
44	Mark W. Weiss	[36] [37]
45	Yihong Xu	[29] [34] [35]
46	Yuhong Yu	[19] [24]
47	Sheng Zhang	[41] [42] [45] [46] [49]

Colors in the list of coauthors