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DBLP keys2009
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVineeth Veetil, Dennis Sylvester, David Blaauw, Saumil Shah, Steffen Rochel: Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence. DAC 2009: 154-159
2008
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPuneet Gupta, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester: Investigation of diffusion rounding for post-lithography analysis. ASP-DAC 2008: 480-485
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAshish Srivastava, Kaviraj Chopra, Saumil Shah, Dennis Sylvester, David Blaauw: A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance. IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 272-285 (2008)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDennis Sylvester, Kanak Agarwal, Saumil Shah: Variability in nanometer CMOS: Impact, analysis, and minimization. Integration 41(3): 319-339 (2008)
2007
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLPuneet Gupta, Andrew B. Kahng, Youngmin Kim, Saumil Shah, Dennis Sylvester: Line-End Shortening is Not Always a Failure. DAC 2007: 270-271
2006
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSaumil Shah, Puneet Gupta, Andrew B. Kahng: Standard cell library optimization for leakage reduction. DAC 2006: 983-986
2005
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAshish Srivastava, Saumil Shah, Kanak Agarwal, Dennis Sylvester, David Blaauw, Stephen W. Director: Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. DAC 2005: 535-540
3no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKaviraj Chopra, Saumil Shah, Ashish Srivastava, David Blaauw, Dennis Sylvester: Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation. ICCAD 2005: 1023-1028
2no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSaumil Shah, Ashish Srivastava, Dushyant Sharma, Dennis Sylvester, David Blaauw, Vladimir Zolotov: Discrete Vt assignment and gate sizing using a self-snapping continuous formulation. ICCAD 2005: 705-712
2004
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSaumil Shah, Kanak Agarwal, Dennis Sylvester: A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters. ICCD 2004: 138-143

Coauthor Index

1Kanak Agarwal [1] [4] [7]
2David Blaauw (David T. Blaauw) [2] [3] [4] [8] [10]
3Kaviraj Chopra [3] [8]
4Stephen W. Director [4]
5Puneet Gupta [5] [6] [9]
6Andrew B. Kahng [5] [6] [9]
7Youngmin Kim [6] [9]
8Steffen Rochel [10]
9Dushyant Sharma [2]
10Ashish Srivastava [2] [3] [4] [8]
11Dennis Sylvester [1] [2] [3] [4] [6] [7] [8] [9] [10]
12Vineeth Veetil [10]
13Vladimir Zolotov [2]

Copyright © Sat Nov 14 20:26:04 2009 by Michael Ley (ley@uni-trier.de)