Amit M. Sheth

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2004

1 Amit M. Sheth, Jacob Savir: Scan Latch Design for Test Applications. J. Electronic Testing 20(2): 213-216 (2004)

	2004
1		Amit M. Sheth, Jacob Savir: Scan Latch Design for Test Applications. J. Electronic Testing 20(2): 213-216 (2004)

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